发明名称 Semiconductor device with photosensitivity
摘要 A photosensor with improved performance is provided with a gate electrode structure for a field effect transistor that includes a semiconductor layer photosensitivity. The gate electrode can be constituted with a kind of metal or a low resistance semiconductor in conjunction with a semiconductor area with photosensitivity adjacent thereto. As a photosensitive semiconductor, amorphous silicon can be used because of its comparatively easy manufacturing method and its high sensitivity. As a field effect transistor, a thin film transistor of amorphous silicon can be used to correspond to the demand for making transistors over a large area. A MOSFET is preferably used as a field effect transistor for the improvement of sensitivity and speed of the sensor.
申请公布号 US5130773(A) 申请公布日期 1992.07.14
申请号 US19900543443 申请日期 1990.06.26
申请人 HITACHI, LTD. 发明人 TSUKADA, TOSHIHISA
分类号 H01L29/78;H01L27/146;H01L29/786;H01L31/10 主分类号 H01L29/78
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