发明名称 METHOD FOR PREDICTING CAPACITANCE OF CONNECTION NETS ON AN INTEGRATED CIRCUIT
摘要 <p>A method estimates the interconnect capacitance of a first net in an integrated circuit. The first step of the method includes the generation of a value which indicates how tightly connected to one another are components connected to the first net. The second step of the method includes the predition of interconnect capacitance of the first net based on the value generated in the first step and a number representing how many components are connected to the first net.</p>
申请公布号 WO1992011657(A1) 申请公布日期 1992.07.09
申请号 EP1991002384 申请日期 1991.12.10
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