发明名称 |
PROCESS FOR THE AUTOMATIC SELECTION OF CONTAINERS AMD MEASURING DEVICE THEREFOR AND AN INSTALLATION WITH SUCH A MEASURING DEVICE |
摘要 |
A method and a system for analyzing gas samples employ at least two semiconductor sensor sets, used alternately. The sensor output signals are time-differentiated. As a result of these features, the time required for analysis can be reduced considerably, especially with an uninterrupted sequence of analyses to be performed in succession. |
申请公布号 |
AU8928291(A) |
申请公布日期 |
1992.07.08 |
申请号 |
AU19910089282 |
申请日期 |
1991.12.04 |
申请人 |
MARTIN LEHMANN |
发明人 |
ULRICH MATTER;RENE NUENLIST;HEINZ BURTSCHER;MICHAEL MUKROWSKY |
分类号 |
G01N21/35;G01N27/00;G01N27/12;G01N33/00;G01N33/44 |
主分类号 |
G01N21/35 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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