发明名称 PROCESS FOR THE AUTOMATIC SELECTION OF CONTAINERS AMD MEASURING DEVICE THEREFOR AND AN INSTALLATION WITH SUCH A MEASURING DEVICE
摘要 A method and a system for analyzing gas samples employ at least two semiconductor sensor sets, used alternately. The sensor output signals are time-differentiated. As a result of these features, the time required for analysis can be reduced considerably, especially with an uninterrupted sequence of analyses to be performed in succession.
申请公布号 AU8928291(A) 申请公布日期 1992.07.08
申请号 AU19910089282 申请日期 1991.12.04
申请人 MARTIN LEHMANN 发明人 ULRICH MATTER;RENE NUENLIST;HEINZ BURTSCHER;MICHAEL MUKROWSKY
分类号 G01N21/35;G01N27/00;G01N27/12;G01N33/00;G01N33/44 主分类号 G01N21/35
代理机构 代理人
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