发明名称 |
ION BEAM PROCESSING DEVICE AND REPLACING METHOD FOR SAMPLE THEREOF |
摘要 |
<p>PURPOSE:To automatize a process of replacing a sample and improve production efficiency by providing a lifting means which lifts a sample holder up and down in replacing the sample. CONSTITUTION:A sample stage 10 in a circle shape on which a sample 5 is placed is provided with a sample holder 6. This sample stage 10 is connected with a motor 13 through gears 11, 12 so as to rotate in the direction of an arrow A in accordance with the drive of the motor 13. A catch rod 14 which is free to be lifted up and down in the direction of an arrow B is positioned around the outside of the sample stage 10. When the catch rod 14 is lifted up, the sample 5 is placed on the tip of the catch rod 14. Thus, sample replacement can be automatized and production efficiency can be improved.</p> |
申请公布号 |
JPH04190548(A) |
申请公布日期 |
1992.07.08 |
申请号 |
JP19900319832 |
申请日期 |
1990.11.22 |
申请人 |
HITACHI LTD |
发明人 |
ONUKI HISAO;OISHI SEITARO;HASHIMOTO ISAO |
分类号 |
C23F4/00;H01J37/20;H01J37/30;H01J37/317;H01L21/265;H01L21/302;H01L21/3065;H01L21/68;H01L21/687 |
主分类号 |
C23F4/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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