发明名称 ION SOURCE FOR MASS SPECTROMETER
摘要 PURPOSE:To approach a specimen to an ionization area and to facilitate the control of vaporization energy, by providing the vaporization energy of the specimen through light and passing the light through an ionization area. CONSTITUTION:A specimen 10 is inserted from the outside of vacuum by means of specimen exchanger 3 while contained in a specimen holder 2, then inserted through a specimen insertion hole 15 into an ionization chamber 1. Said specimen holder 2, lens 13 and a light source 14 are arranged on a line, and the light emitted from the light source 14 is focused through a lens 13 onto a specimen 10. The specimen 10 receiving the light energy will be vaporized and dispersed into the ionizaton chamber and is ionized. The ionized ion is pushed by a repeller electrode 7 and drawn out through an ion injection hole 12, then led through a lens 8, earth electrode 9 to a mass spectrometer, and subjected to mass analysis.
申请公布号 JPS56132757(A) 申请公布日期 1981.10.17
申请号 JP19800034105 申请日期 1980.03.19
申请人 HITACHI LTD 发明人 HIROSE HIROSHI;TAKAHASHI SADAO
分类号 G01N27/62;H01J49/04;H01J49/10 主分类号 G01N27/62
代理机构 代理人
主权项
地址
您可能感兴趣的专利