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发明名称
SEMICONDUCTOR INTEGRATED CIRCUIT AND ITS TESTING METHOD
摘要
申请公布号
JPH04186744(A)
申请公布日期
1992.07.03
申请号
JP19900315610
申请日期
1990.11.20
申请人
FUJITSU LTD
发明人
KIKUCHI HIDEO
分类号
G01R31/28;H01L21/66;H01L21/82
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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