发明名称 DIAGNOSTIC DEVICE FOR ABNORMALITY OF PLANT
摘要 <p>PURPOSE:To identify the cause of abnormality in an atomic power plant with high accuracy by providing a knowledge base for the characteristics of a plant forming device, etc. and a means which estimates the prospective causes of abnormality and judges a prospective cause whose measurement signal coincides with the fluctuation of the amount of processing, etc. to be the first cause of the abnormality, which amount of processing can be inferred from the prospective causes. CONSTITUTION:The process input portion 3 of a plant abnormality diagnosing device 1 stores the amount A1 of processing of a power plant 2 and the operat ing state A2 of equipment on a plant data base 7. An operation desired value evaluating portion 4 inputs data B on the state of the plant and calculates a desired value C following the evaluation method J2 of an operation desired value stored on a knowledge data base 9. An abnormality detecting portion 6 detects abnormalities from state data F1 of the amount of processing, the deviation of an operation desired value F2 and a threshold J3 used for judging abnormalities. An inference portion 8 for the causes of abnormalities infers the primary cause of an abnormality from data H1 on detected abnormalities, state data H2 and function knowledge J1, and outputs the result K of diagnosis.</p>
申请公布号 JPH04175694(A) 申请公布日期 1992.06.23
申请号 JP19900305503 申请日期 1990.11.08
申请人 MITSUBISHI ELECTRIC CORP 发明人 SAEKI AKIRA
分类号 G21C17/00;G05B23/02;G06F9/44;G06N5/04;G21D3/04 主分类号 G21C17/00
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