| 摘要 |
PURPOSE:To make inspection with good accuracy without accompanying a false information by comparing a candidate data for defects with an optimum through-hole mask. CONSTITUTION:A temporary through-hole mask based on the position of a hole is formed by a masking part 3 by the use of a master board, and stored in a mask memory part 32. A printed circuit board 10 to be inspected is fixedly positioned to a table 54 of an alignment part 5. An alignment pattern is photographed. The position of the circuit board 10 is corrected based on a reference value. A CCD camera 11 is started to photograph the circuit board 10. Data of a comparative through-hole mask is read up to one piece in the scanning direction from the memory part 32 synchronously with the photographing. The read comparative through-hole mask is input to a comparing part 822 of a defect data part 82 and compared with a defect candidate data from an inspecting/processing part 821, so that the mask is processed. This procedure is repeated for the number of previous pieces in the scanning direction, and further for the whole scanning path, thus completing the inspection of defects of one circuit board 10. |
