发明名称 INSPECTING APPARATUS FOR NONMETALLIC INCLUSION
摘要 PURPOSE:To enable execution of accurate evaluation even when a measuring magnification is lowered, by generating an address in a prescribed sphere of a sample converted into video signals and by comparing the lightness of a pixel corresponding thereto with a predetermined threshold. CONSTITUTION:The density of each pixel of a sample image constituting video signals for one screen is converted into digital density information by an A/D converter 322 and it is taken in by a frame memory 323. An address memory 324 stores addresses provided at prescribed intervals longitudinally and laterally in a prescribed sphere of a sample, and control CPU 321 reads out an address value corresponding to a cleared address counter from this memory 324 and reads out density information corresponding thereto from the memory 323. When this density information is found to be lower than a predetermined threshold by comparison, it is judged that there is a nonmetallic inclusion on the sample corresponding to the pixel, and when it is higher, it is judged that there is a metal material thereon. This is counted by a counter 325 and outputted as an evaluation value. Accordingly, a grid line is dispensed with and execution of accurate evaluation is enabled even when a measuring magnification is lowered to about 200 magnifications.
申请公布号 JPH04174359(A) 申请公布日期 1992.06.22
申请号 JP19900300414 申请日期 1990.11.06
申请人 TOSHIBA ENG CO LTD;DAIDO STEEL CO LTD 发明人 MATSUSHITA SATOSHI;KAWASAKI AKIRA
分类号 G01N33/20;G06T1/00;G06T7/00 主分类号 G01N33/20
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