发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To enable manufacture by a simplified process and sure electrical connection to a conductive region, by depositing a metal film pattern, only on the pattern of a polysilicon film by using selective CVD, which film is formed on the upper surface of an insulating film and the inner surfaces of contact holes. CONSTITUTION:A polysilicon film 13 is deposited by CVD, so as to cover the upper surface of an insulating film 12 and the inner surfaces of contact holes 12a. A resist pattern 14 is formed on the polysilicon film 13, which is patterned by etching using the resist pattern 14 as a mask. A section of the polysilicon film 13 along 1B-1B after patterning is shown in figure. The resist pattern 14 is eliminated and the polysilicon film pattern 13 is exposed. A metal film pattern 15 is formed by selective CVD, so as to fill the contact holes 12a and cover only the polysilicon film pattern.
申请公布号 JPH04171921(A) 申请公布日期 1992.06.19
申请号 JP19900301541 申请日期 1990.11.06
申请人 MITSUBISHI ELECTRIC CORP 发明人 ONO YOSHIKAZU
分类号 H01L21/28;H01L21/768;H01L21/8242;H01L23/532;H01L27/10;H01L27/108 主分类号 H01L21/28
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