发明名称 WAFER POLISHING METHOD AND TOP RING THEREOF
摘要 PURPOSE:To polish a wafer with high accuracy by suspending the rotation of a weight by a rotation checking means. CONSTITUTION:The whole surface of a plate 2 is uniformly pressed by a flexible membrane 9 with fluid regulated in pressure, which is injected out of a fluid supply pipe 10, and when a turn table 7 and a top ring are rotated by a rotation mechanism while grinding lubricant is being applied onto a cloth 8 out of a nozzle 11, the lower surface of a wafer 1 is thereby polished at suitable polishing speeds. Since the weight 6 is rested on a resting table 12 while being fixed onto a top ring spindle 14 which is not rotated because of a rotation checking arm 13 penetrating through the weight, the weight 6 is therefore not rotated at all, even if a head is rotated.
申请公布号 JPH04171170(A) 申请公布日期 1992.06.18
申请号 JP19900299640 申请日期 1990.11.05
申请人 FUJIKOSHI KIKAI KOUGIYOU KK 发明人 NAKAMURA YOSHIO
分类号 B24B27/04;B24B37/005;B24B37/30;H01L21/304 主分类号 B24B27/04
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