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发明名称
MATERIAL TESTER WITH SCANNING TYPE ELECTRON MICROSCOPE
摘要
申请公布号
JPH04169048(A)
申请公布日期
1992.06.17
申请号
JP19900295098
申请日期
1990.10.31
申请人
SHIMADZU CORP
发明人
HORIKAWA JUN
分类号
H01J37/20;G01N3/34;H01J37/21;H01J37/28
主分类号
H01J37/20
代理机构
代理人
主权项
地址
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