摘要 |
The temperature T is measured a perovskite which is provided, on each of two opposite main surfaces, with an electrode to form a condenser (I). The capacity C is measured and, with the aid of a previously-plotted calibration graph C = f(T), the temperature T is determined. The improvement is that there is used, as perovskite, a substrate, produced from a material, as support for an electrical conductor, the temperature of which is to be determined, is so applied, as first electrode of, on the support substrate, that a good thermal contact exists between the first electrode and the substrate.
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申请人 |
ABB PATENT GMBH, 6800 MANNHEIM, DE |
发明人 |
KLEMT, ECKEHARD, DIPL.-PHYS. DR., 6900 HEIDELBERG, DE |