| 发明名称 |
APPARATUS FOR MEASURING AN AC ELECTRICAL PARAMETER OF A DEVICE |
| 摘要 |
<p>The present invention relates to apparatus for measuring the AC electrical parameters of a circuit element (Device-Under-Test, DUT), such as a resistor, a capacitor or an inductor, at the desired frequency of a signal while applying a DC bias to the DUT. The present invention provides an apparatus capable of measurement with less error even in the lower-frequency range.</p> |
| 申请公布号 |
GB2217466(B) |
申请公布日期 |
1992.06.17 |
| 申请号 |
GB19890004008 |
申请日期 |
1989.02.22 |
| 申请人 |
* HEWLETT-PACKARD COMPANY |
发明人 |
HIDESHI * TANAKA;KAZUYUKI * YAGI |
| 分类号 |
G01R27/02;G01R27/00;G01R27/14;G01R27/26;G06G7/625;H03H11/48;(IPC1-7):G01R27/00 |
主分类号 |
G01R27/02 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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