Apparatus for and method of pressing pins of an IC for testing

摘要

A socket-like structure with contact terminals for testing IC pieces is set at a specified position and a vertically movable block is set above this socket-like structure. A frame surrounding this block is provided with a lock screw by which a pin press can be pressed between the block and the frame either tightly or loosely. The pin press has downwardly protruding edges which are patterned according to the pins of the IC pieces to be tested. The pin press is lowered while it is only loosely pressed between the block and the frame and thereby adjusts its position according to the socket-like structure placed below. The lock screw is tightened thereupon to fasten the pin pressed at this adjusted position. With the pin press thus fastened at the adjusted position, IC pieces to be tested are delivered onto the socket-like structure one at a time and the pin press is lowered to thereby correctly press the pins of the IC piece to be tested against the terminals for the testing device.