发明名称 PROTECTIVE FILM FORMING METHOD AND COMPOUND SEMICONDUCTOR LIGHT EMITTING DIODE PROVIDED THEREWITH
摘要 PURPOSE:To prevent a gap from being formed between an electrode and a protective film so as to protect a light emitting diode against deterioration in characteristics by a method wherein the protective film is provided so as to cover the surface of a semiconductor and a part around the electrode. CONSTITUTION:An ohmic electrode 2 of Au alloy or the like is deposited on an N-type AlGaAs clad layer 1, then Au is deposited for the formation of a bonding pad electrode 3, and an electrode pattern is formed through a photolithography method. Then, a protective film 4 of SiO2. or the like is formed on the whole surface of the N-type AlGaAs clad layer 1 including the electrode through a thermal decomposition method or a plasma CVD method, and then the protective film 4 located around the center of the electrode 3 is removed through a chemical etching method so as to leave the film 4 unremoved only on the peripheries of the electrodes 2 and 3, whereby the protective film 4 is patterned so as to cover the surface of the semiconductor and a part around the electrode. By this setup, a gap is prevented from being induced between the ohmic electrode 2 and the protective film 4, and the surface of an AlGaAs clad layer is protected against oxidation, whereby a light emitting diode of this design can be protected against deterioration in characteristics.
申请公布号 JPH04167569(A) 申请公布日期 1992.06.15
申请号 JP19900294883 申请日期 1990.10.31
申请人 MITSUBISHI KASEI POLYTEC CO;MITSUBISHI KASEI CORP 发明人 IBUKA TOSHIHIKO;NOGUCHI MASAHIRO
分类号 H01L33/20;H01L33/30;H01L33/40;H01L33/62 主分类号 H01L33/20
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