发明名称 CONTROL SYSTEM FOR A GRAIN DRYER AND PROBE MOUNTING ARRANGEMENT THEREFOR
摘要 <p>A control system (80-1, 80-2) is provided for a grain dryer (10) having a path (22, 24) along which grain is conveyed from an entry opening (28) between first (12, 14) and second (18, 20) walls provided with second openings through which drying air can flow. A source (16) on the side of the first wall opposite the grain provides a flow of air through the first wall through the grain and through the second wall to dry the grain. The grain dryer (10) further comprises metering rolls (30, 32) between the walls (12, 18, 14, 20) adjacent the end opposite the entry opening (28) to control the movement of grain along the path (22, 24). The control system includes a first moisture probe (80-1) positioned adjacent the entry opening (28), a second moisture probe (80-2) positioned adjacent the metering rolls (30, 32), a microcomputer and circuitry for coupling the first and second moisture probes and the metering rolls to the microcomputer for control of the metering rolls based upon the outputs of the moisture probes.</p>
申请公布号 WO1992009858(A1) 申请公布日期 1992.06.11
申请号 US1991009046 申请日期 1991.11.26
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