| 摘要 |
A touch probe comprises a stylus-supporting member kinematically supported with respect to a housing at six points of contact between the stylus-supporting member and the housing. At each of these points of contact a conducting surface on the stylus-supporting member abuts a conducting surface on the housing. Each of the contacts are included in an electrical circuit. The conducting material of each of the conducting surfaces comprises a material having a resistivity of less than 8 mu OMEGA cm and a melting voltage of at least 0.7 volts. A material having these properties is less susceptible to physical degradation than prior art materials used in such a probe. In a preferred embodiment the conducting material of each of the conducting surfaces is made of pure tungsten. |
