| 摘要 |
<p>An apparatus for diagnosing faults in a device (16, see Fig. 3) equipped with boundary-scan test capability includes means (including microprocessor 22, state capture RAM 26, 28, vector formatters 30A-30F, and driver/receiver hybrids 32A-32F, 34A-34F) whereby a boundary-scan tester can store serial test data upon detection of a fault in a device under test (DUT). The test data corresponding to the frame vector associated with the fault is formatted so that all information from the parallel tester inputs and the TAP scan registers can be simultaneously analyzed. A method for diagnosing faults is also disclosed. <IMAGE></p> |
