| 摘要 |
An arrangement for determining on approximation the equivalent circuit diagram of an electrical or electronic element at high frequencies includes a measuring apparatus (4), to which the element to be represented as a two-port element (59) or a one-port element (1) is connected through connection members (2; 57, 58, 60) and which measures over a preselected frequency range the parameters of the stray matrix of the two-port element of the impedance or the reflection factor of the one-port element with the connection members. To the measuring apparatus (4) is connected an evaluation circuit (7), which corrects the measurement result by inclusion of two-port parameters of the connection member(s) determined before the measurement and which calculates for a preselected equivalent circuit diagram of the element from the corrected measurement result values of the equivalent circuit diagram elements by means of an optimization strategy.
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