| 摘要 |
PURPOSE:To enable a highly reliable test to be efficiently executed, and ensure higher product quality by enabling the entry clock of a clock counter to be selected concurrently with time setting in the clock counter. CONSTITUTION:For example, when the operation of a day and time counter 5 is tested, using a detection signal 23 for a month with 30 or less days, a February detection signal 24 and a leap year detection signal 25 respectively peculiar to a perpetual calendar IC, the selection of only day, month and year clock counters 5 to 7 for time setting is enough to concurrently update corresponding clock selection flag registers 13 to 15. No other setting, therefore, is required. In this case, '1' is set in a register 13 corresponding to the counter 5, while '0' is set in registers 14 and 15 corresponding to the counters 6 and 7. The operation of other clock counters 2, 3, 4 and 8, therefore, is not influenced, and other operation tests can be concurrently undertaken, thereby improving test efficiency and substantially reducing a test time. |
