| 摘要 |
PURPOSE:To speed up test program actuation and to facilitate test program update by storing a test program in a semiconductor memory which can be connected to a main memory. CONSTITUTION:An IC card 21 includes a memory 23 composed of a ROM or RAM and the memory 23 is connected to the address bus and data bus of the device main body through an IC card interface 20 and receives a source voltage and a chip select signal. Then an instruction for indicating the start of the test program is inputted and when it is decided that the IC card 21 stored with the test program is inserted into the main body, the control of a test program CPU 22 stored on the IC card 21 is transferred and the test program is started. Consequently, the test program is started at a high speed and easily updated. |
