| 摘要 |
The adapter for an electronic testing device allows the contact raster of the latter to be matched to the differing circuit configurations of the circuit boards. It comprises a base plate (23,33) with bores corresponding to the contact raster of the testing device and at least one adapter plate (21,31) which has bores corresponding to the test nodes of the circuit board configuration held at a vertical spacing from the base plate (23,33) via intermediate spacers (24,34) which are sprung in the vertical direction. The test pins (25,35) inserted through the bores have spring contacts at their ends in contact with the test nodes. Pref. each intermediate spacer (24,34) comprises an annular spring with 2 diametrically opposed planar connection zones (37,37') respectively attached to the base plate (23,33) and the adapter plate (21,31).
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