| 摘要 |
PURPOSE:To test the disconnection of individual bit and a short circuit between all bits in a short time with high reliability by making a value corresponding to the order bit of the bus line of a pattern n+1 as 1, making a (1 to m-1)th bit as 0s, and making the order of the numbering of the bit of the bus line optional. CONSTITUTION:In the pattern n+1, a setting where one is 0 data and the other is 1 to a pair of 2 bits whose bus lines are all different is included in either of the patterns 1 to n. Concerning each bit of bit numbers 1 to m-2, the pattern whose bit becomes 1 or the pattern whose bit becomes 0 are included in either of the patterns 1 to n respectively. And the pattern whose bit number 0 becomes 0 and the pattern whose bit number m-2 becomes 1 are included in either of the patterns 1 to n respectively. And in the pattern n+1, the bit number 0 becomes 1 and the bit number m-1 becomes 0. Thus, the disconnection of individual bit and the short circuit between all the bits can be tested in a short time with high reliability. |
