发明名称 TEST SYSTEM FOR INFORMATION PROCESSING SYSTEM
摘要 PURPOSE:To prevent the setting error of a voltage margin by altering the initial value of the voltage margin to the voltage margin when the execution result of a test program is normal in a particular case. CONSTITUTION:A service processor 32 sets the voltage margin of an information processing system 31 with the voltage margin value which is decided prior to the start of the test program and executes the test program testing respective devices which the information processing system 31 has. When the execution result is normal, the voltage margin value is changed by certain amount so as to repeat respective operations until the execution result of the test program becomes abnormal. Thus, the setting error of the voltage margin is eliminated.
申请公布号 JPH04148437(A) 申请公布日期 1992.05.21
申请号 JP19900273643 申请日期 1990.10.12
申请人 NEC CORP 发明人 NASU SADAO
分类号 G06F11/22;G06F11/24 主分类号 G06F11/22
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