发明名称 DIAGNOSING DEVICE FOR ELECTRICAL INSTRUMENTATION SYSTEM DETERIORATION
摘要 <p>PURPOSE:To obtain deterioration information of high precision by a simple device constitution by searching the vibration and temperature change of an object to be monitored from both a visible light image signal and an infrared ray image signal outputted from a TV camera, comparing them with past data, and deciding the deterioration of the object to be monitored. CONSTITUTION:The image of the object to be monitored obtained by a TV camera 2 is divided into the visible light image signal and the infrared ray image signal, and the visible light image signal is processed by an object to be monitored position deciding device 10, based on a trigonometrical survey in order to search a distance from the TV camera 2 to an object to be monitored 1. Also, the present visible light image signal is compared with the visible light image signal before a fixed time by a vibration monitoring device 8, and the vibration of the object to be monitored is monitored by the deviation value of both of them. Moreover, the temperature distribution of the object to be monitored is monitored by the infrared ray image signal by a temperature distribution monitoring device 9, and the present infrared ray image signal is compared with that before the fixed time in order to monitor the temperature change. Thus, the deterioration information whose accuracy is high can be timely obtained by the simply constituted device.</p>
申请公布号 JPH04148309(A) 申请公布日期 1992.05.21
申请号 JP19900272920 申请日期 1990.10.11
申请人 TOSHIBA CORP 发明人 KAWAMURA ATSUO
分类号 G01N25/72;G01N21/84;G05B23/02;H04N7/18 主分类号 G01N25/72
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