发明名称 SHARED MEMORY TEST SYSTEM
摘要 PURPOSE:To shorten test time by performing batch processing in parallel by means of respective charge area test means equipped with a central processing unit. CONSTITUTION:A test program 13i is loaded in the memory of each central information processors (CPU) 12i by the DISK of an external storage device 14. In such a case, as there are eight CPUs 12i in the information processing system, the memory area of shared memories 111 and 112 are divided into eights, and 4Gb of shared memory (SSU) 1-1 area is allocated to one CPU. The 4Gb of different charge area is allocated to each CPU like the 4Gb of the SSU1-2 area to the CPU. Therefore, a test program 13i for each CPU executes access test against each allocated charge area simultaneously. Thus, the test time can be shortened.
申请公布号 JPH04148462(A) 申请公布日期 1992.05.21
申请号 JP19900272279 申请日期 1990.10.12
申请人 FUJITSU LTD 发明人 MIYAHARA SHINJI
分类号 G06F12/16;G06F11/22;G06F15/16;G06F15/177 主分类号 G06F12/16
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