发明名称 |
Method of producing low resistance contacts. |
摘要 |
The method for fabrication of low resistance semiconductor contacts includes depositing an insulating layer (14) over the integrated circuit. An adhesion layer (16) is then formed over the insulating layer. A contact opening (18) is formed through the adhesion layer and the insulating layer. A metal silicide layer (20) is then deposited over the integrated circuit including the contact opening. The metal silicide layer and adhesion layer are then etched to form interconnections. <IMAGE> |
申请公布号 |
EP0486244(A1) |
申请公布日期 |
1992.05.20 |
申请号 |
EP19910310398 |
申请日期 |
1991.11.11 |
申请人 |
SGS-THOMSON MICROELECTRONICS, INC. (A DELAWARE CORP.) |
发明人 |
MILLER, ROBERT OTIS;WEI, CHE-CHIA |
分类号 |
H01L21/28;H01L21/3205;H01L21/768;H01L23/532 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|