发明名称 Method of producing low resistance contacts.
摘要 The method for fabrication of low resistance semiconductor contacts includes depositing an insulating layer (14) over the integrated circuit. An adhesion layer (16) is then formed over the insulating layer. A contact opening (18) is formed through the adhesion layer and the insulating layer. A metal silicide layer (20) is then deposited over the integrated circuit including the contact opening. The metal silicide layer and adhesion layer are then etched to form interconnections. <IMAGE>
申请公布号 EP0486244(A1) 申请公布日期 1992.05.20
申请号 EP19910310398 申请日期 1991.11.11
申请人 SGS-THOMSON MICROELECTRONICS, INC. (A DELAWARE CORP.) 发明人 MILLER, ROBERT OTIS;WEI, CHE-CHIA
分类号 H01L21/28;H01L21/3205;H01L21/768;H01L23/532 主分类号 H01L21/28
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