发明名称 CANTILEVER PROBE, SCANNING TUNNELLING MICROSCOPE AND INFORMATION PROCESSOR USING THE PROBE
摘要 PURPOSE:To reduce noise and to detect a tunnel current with excellent S/N by providing a shield electrode among a drive electrode, a leadout electrode and a probe. CONSTITUTION:A probe is formed with a cantilever made of a piezoelectric bimorph whose one end is fixed onto a Si substrate, the piezoelectric bimorph layer consists of 2-split electrodes 2a, 2b, a piezoelectric layer 5, a common electrode 3, a piezoelectric layer 5 and 2-split electrodes 4a, 4b and each electrode is prolonged up to a fixed end of the cantilever and a pad 13 is provided thereto and connected to an external drive circuit by wire bonding or the like. Furthermore, a shield electrode 1 is formed on the 2-split electrodes 2a, 2b of the piezoelectric bimorph layer via an insulation layer 10, and a leadout electrode and the probe 7 are provided similarly on the electrodes via the insulation layer 10. Thus, noise induced from the drive electrodes 2 - 4 to the probe 7 and the leadout electrode 6 is reduced and a tunnel current with excellent S/N is detected.
申请公布号 JPH04147448(A) 申请公布日期 1992.05.20
申请号 JP19900269540 申请日期 1990.10.09
申请人 CANON INC 发明人 NOSE HIROYASU;SAKAI KUNIHIRO;KAWASE TOSHIMITSU;MIYAZAKI TOSHIHIKO;SHINJO KATSUHIKO;HIRAI YUTAKA;YAGI TAKAYUKI;HATANAKA KATSUNORI;YAMAMOTO KEISUKE;KASANUKI YUJI;SUZUKI YOSHIO
分类号 G01B7/34;G01N27/00;G01N37/00;G01Q10/02;G01Q10/04;G01Q30/18;G01Q60/10;G01Q60/16;G01Q60/38;G01Q80/00;G11B9/00;G11B9/14;H01J37/28 主分类号 G01B7/34
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