发明名称 |
Internal test circuitry for integrated circuits using token passing to select testing ports |
摘要 |
Built-in test circuitry, which is appropriate for monolithic integrated circuit chips that are to be connected in a plural-chip package, uses electronic token passing to select one of the test input ports in the circuitry to be tested for application of test input vectors. The built-in test circuitry also uses electronic token passing to select one of the test output ports in the circuitry to be tested from which test results are to be supplied.
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申请公布号 |
US5115437(A) |
申请公布日期 |
1992.05.19 |
申请号 |
US19900487481 |
申请日期 |
1990.03.02 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
WELLES, II, KENNETH B.;HARTLEY, RICHARD I.;HARTMAN, MICHAEL J. |
分类号 |
G01R31/3185 |
主分类号 |
G01R31/3185 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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