发明名称 SCAN PASS CIRCUIT
摘要 PURPOSE:To facilitate timing design of clock signals by contriving a scan-pass circuit in such a way that each flip-flop reads the output at the time before a second clock signal is input into the preceding flip-flop, and outputs it so as to be successively shifted. CONSTITUTION:At the time of a scan-pass test, as a clock signal 10 for the scan-pass test, a clock for operating a shift resister is input. The clock signal 10 becomes the clock signal of a flip-flop 3 via a selector 8. The output of the selector 8 enters the clock terminal C of a flip-flop 2 via a selector 7. The value that the flip-flop 3 reads is the Q output signal 15 of the flip-flop 2 at the time before the clock is input into the flip-flop 2. Since it is not necessary to simultaneously input the clock signals of respective flip-flops, even if there is a clock skew or the like, shift-register operation can be carried out, thus clock-signal design can be facilitated.
申请公布号 JPH04145380(A) 申请公布日期 1992.05.19
申请号 JP19900270051 申请日期 1990.10.08
申请人 NEC CORP 发明人 OZAKI HIDEHARU
分类号 G01R31/28;G01R31/317;G01R31/3185;G06F11/22 主分类号 G01R31/28
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