CHECKING METHOD FOR IMPURITY DEGREE OF SEMICONDUCTOR DEVICE
摘要
In a measuring method for speading resistance and impurity concentration of semiconductor board, two probes measure spreading resistance downwardly of a semicomductor board on a slope of an angle of inclination. Impurity concentration is known from the spreading resistance mearsured. For two dimensional measurement spreading resistance is measured on a slope of angles of inclination in the planes of X-Y and X-Z.
申请公布号
KR920003827(B1)
申请公布日期
1992.05.15
申请号
KR19890011896
申请日期
1989.08.21
申请人
KOREA ELECTRONIC TELECOMMUNICATION RESEARCH INSTITUTE
发明人
YANG, JUN - WOOK;SHIM, KYU - WHAN;CHOI, YOUNG - KYU;LEE, JAI - SIN;LEE, JEEN - HEI;PARK, CHUL - SOON;KANG, JIN - YOUNG