发明名称 BACK BIAS SHUNT CIRCUIT OF SEMICONDUCTOR MEMORY APPARATUS
摘要 <p>The back-bias generating circuit for preventing a latch-up of a CMOS device upon power-on comprises a shunt circuit. The shunt circuit comprises a node (20), a means (60) for supplying power voltage to the node under the control of a signal for sensing the application of power voltage, an output means (40) (59) for delaying the sensing signal to output the delayed signal, the sensing signal having a predetermined pulse width, a discharging means (70) for discharging the potential of the node into a low level under the control of the output means (40,59), a discharging means (90) for discharging a back-bias voltage into a ground level under the control of the voltage state of the node (20) and a means (80) for connecting the back-bias voltage to the node.</p>
申请公布号 KR920003846(B1) 申请公布日期 1992.05.15
申请号 KR19890020598 申请日期 1989.12.30
申请人 SAM SUNG ELECTRONICS CO., LTD. 发明人 RYU, JAE - HWAN
分类号 G06F12/16;(IPC1-7):G06F12/16 主分类号 G06F12/16
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