发明名称 MATERIAL INSPECTION DEVICE
摘要 PURPOSE:To enable a material data for a same part of the material to be compared and evaluated accurately by rotating a measurement head which incorporates a sensor for inspecting a plurality of materials and then measuring a characteristic value of the material while changing the used sensor. CONSTITUTION:A head for measurement 1 incorporating a sensor for measurement 32 is allowed to run on a tested body by driving a support arm 9 by a position-adjusting means 33 and the sensor for measurement 32 is adjusted to a measurement point of the tested body by a fine-adjusting means 34. Each kind of current is allowed to flow to a supporting arm 6 which is formed by a leg using an electromagnet, thus enabling each magnetic field to be formed at a measurement point on the tested body. Also, a plurality of sensors are placed at the head for measurement 1 and the head 1 is rotated and driven, thus enabling various kinds of sensors for inspecting tested body to be selected. Namely, sensor traveling which is predetermined by remote drive, sensor exchange, and inspection data collection are performed and at the same time used data of the tested body is collected.
申请公布号 JPH04140658(A) 申请公布日期 1992.05.14
申请号 JP19900263204 申请日期 1990.10.02
申请人 TOSHIBA CORP 发明人 UCHIDA KUNIHARU
分类号 G01N25/72;G01N27/82;G01N29/26 主分类号 G01N25/72
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