| 摘要 |
In a process for the opto-electronic measurement of the shape of objects, the object (4) to be examined is illuminated by laser light sources (5), the beam of which is widened by an optical system (not shown) in a plane so that a bright line (6) is formed on the object (4) by each laser light source (5), whereby the lines generally overlap partially. Each line (6) is detected by a semiconductor camera (7) in front of which is placed a filter (8) which is transparent only to the light emitted by the relevant laser (5). The laser light sources (5) are connected via control lines (11) to a control unit (10) which is coupled to an assessment unit (9). The assessment unit (9) comprises a computer to which the digitised video signals from the camera (7) are taken. (12) is a unit for processing the signals of the individual cameras (7) to the polygonal sections taken by each camera, (13) is a unit to combine the individual polygonal traces to form the outline of the object, (14) is a monitor to display the measured object, (15) is a printer to print out the dimensions of the object and (16) is a plotter for the graphic display of the object. In order to approximate or adapt the image size of the line of light (6) to the size of the sensor component of the semiconductor camera (7), the image scale is changed or varied or the size of the measuring field of the camera (7) concerned is altered dependently upon the size of the line of light (6) generated on the object (4) or matched thereto. |
