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发明名称
SEMICONDUCTOR INTEGRATED CIRCUIT TESTER
摘要
申请公布号
JPH04139846(A)
申请公布日期
1992.05.13
申请号
JP19900264124
申请日期
1990.10.01
申请人
MITSUBISHI ELECTRIC CORP
发明人
SUZUKI MASAHIRO
分类号
H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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