发明名称 SMEAR QUANTITY MEASURING METHOD FOR SOLID-STATE IMAGING DEVICE
摘要 PURPOSE:To measure smear quantity with high accuracy by providing a second process to measure the output voltage of an output part as a second output voltage and a third process to calculate the smear quantity based on the ratio of the second output voltage to a first output voltage. CONSTITUTION:By impressing a voltage at a high level to a substrate 2, a so-called electronic shutter operation is obtained to sweep signal charges stored in a photosensitive part 3 out to the substrate 2. By this electronic shutter operation, the generation of blooming can be prevented in the case of irradiation with the excess quantity of light. Therefore, by using the output voltage of the output part in the case of an electronic shutter and the output voltage in the case of a normal operation impressing a voltage at a low level to the substrate 2 as the calculation parameters of the smear quantity, accuracy for measuring the smear quantity is improved. Thus, since the smear quantity can be measured without being affected by the blooming operation by the electronic shutter operation even in the case of irradiation with the excess quantity of light, accuracy for measurement can be improved.
申请公布号 JPH04135389(A) 申请公布日期 1992.05.08
申请号 JP19900258514 申请日期 1990.09.27
申请人 SONY CORP 发明人 SUZUKI SATOYUKI
分类号 G01R31/26;G01J1/44;H01L27/14;H01L27/148;H04N5/335;H04N5/341;H04N5/353;H04N5/359;H04N5/369;H04N5/3728;H04N17/00 主分类号 G01R31/26
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