FAULT DETECTING CIRCUIT FOR SEMICONDUCTOR INTEGRATED CIRCUIT,申请号JP19900258321-传众专利搜索

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发明名称	FAULT DETECTING CIRCUIT FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要
申请公布号	JPH04135260(A)	申请公布日期	1992.05.08
申请号	JP19900258321	申请日期	1990.09.27
申请人	OKI ELECTRIC IND CO LTD	发明人	UETAKE YOSHIKATSU;HAYASHI KENTARO;HAGIO MASAMI;OCHIAI TAKAYOSHI
分类号	G06F11/22;G06F13/00	主分类号	G06F11/22
代理机构		代理人
主权项
地址

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