发明名称 DISPLAY ELEMENT INSPECTION SYSTEM
摘要 PURPOSE:To evaluate the influence of background picture elements more accurately by fixing the state setting conditions of the background picture elements in the ON state and OFF state of an object picture element and inspecting the display element according to the difference between brightness information on the screen when the object picture element illuminates and that when the element goes out. CONSTITUTION:Solid-line rectangles show LCD picture element images which are correctly formed on a photodetection surface through the lens of a CCD camera. Enlarged images corresponding to images A and B which are enlarged and correctly formed are conceptionally, for example, 1 and 2. At this time, when the object picture element A to be tested is inspected while the adjacent picture element B turns on, the state setting conditions of background picture elements in the ON and OFF states of the picture element A are fixed and the difference in brightness information between CCD picture elements read out of the enlarged picture elements images in the respective cases is calculated to cancel light from the background picture elements. Consequently, the influence of the background picture elements can correctly be evaluated and the influence of a defective picture element is eliminated.
申请公布号 JPH04133088(A) 申请公布日期 1992.05.07
申请号 JP19900254073 申请日期 1990.09.26
申请人 MINATO EREKUTORONIKUSU KK 发明人 EGAWA HIROSHI
分类号 G01N21/84;G02F1/13;G06T1/00;G09F9/00;G09G3/20;G09G3/36 主分类号 G01N21/84
代理机构 代理人
主权项
地址