UNDERSTANDING TEST CIRCUIT,申请号JP19900251054-传众专利搜索

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发明名称	UNDERSTANDING TEST CIRCUIT
摘要
申请公布号	JPH04129438(A)	申请公布日期	1992.04.30
申请号	JP19900251054	申请日期	1990.09.20
申请人	FUJITSU LTD	发明人	FUCHI YASUHIRO;UOZUMI KAZUTAKA
分类号	H04M3/26;H04J3/14;H04L25/02;H04M3/32	主分类号	H04M3/26
代理机构		代理人
主权项
地址

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