| 摘要 |
1. Method of producing diodes, in particular PIN and charge storage diodes, using dry heat method and subsequently load testing them on durability frames; is characterised in that diodes are subjected to 80/150 degrees C heat for 70/120 hours, load tested for 70/120 hours on the durability frame with the maximum constant current, downstream of the flow, applicable to a given diode type under the technical conditions.
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