Systems for measuring the refractive index profile of optical components.

摘要

The system uses a monochromatic radiation source (1) and an acousto-optic modulator (2), which is driven by a periodically variable frequency. The modulator emits a first beam having the same wavelength as the source and a second beam, whose wavelength and emission direction vary with the modulating frequency. After the second beam has been collimated, radiations of both beams are sent towards the component under test and an electrical signal with varying frequency is generated representative of the beat between such radiations at the output from the component. A spectral analysis of the beat signal is carried out, and the refractive index value is derived from the position taken by the various frequencies of the beat signal on a detection plane. <IMAGE>