发明名称 SPECTROPHOTOMETER
摘要 <p>PURPOSE:To measure correct 0 deg. reflection by perpendicularly applying reflection light to a specimen with a beam splitter utilized, leading transmitted light to a trap and eliminating light to reduce stray light. CONSTITUTION:A beam splitter 6 transmits 50% of specimen light which has been split and perpendicularly reflects 50% of the specimen light. 50% of transmitted light is eliminated in a trap to prevent it from being stray light. Object light IR is incident on an integrating sphere via a troidal mirror 13 while a light amount is adjusted to be balanced with the specimen light by a mask 14, and a white plate 11 is used to convert photo signals into electric signals by a diffusion reflection sensor similarly to the specimen light. The electric signals are converted into electric signals by a sensor 12, and after it is processed by a signal arithmetic unit 15 via an amplifier and an A/D-converter, it is output to a display or a printer 16. Therefore, after a reference sample marked with a reflectance value is used to compensate 100%R over an entire measured wavelength range, the specimen is measured and by multiplying an obtained reflectance Rs by a reflectance Rst of the reference sample, an absolute reflectance of the specimen can be calculated.</p>
申请公布号 JPH04125431(A) 申请公布日期 1992.04.24
申请号 JP19900244035 申请日期 1990.09.17
申请人 HITACHI LTD 发明人 MURAKOSHI TAKEO
分类号 G01J3/42;G01N21/55 主分类号 G01J3/42
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