发明名称 Gauge for measuring the thickness of a coating on a substrate.
摘要 <p>A gauge for measuring the thickness of a coating on a substrate includes a housing, an indicator rod movably positioned within the housing, a magnet mounted on the forward end of the indicator rod, and a spring connected to the rearward end of the indicator rod. The housing can have a slot extending along a portion thereof that communicates with the interior of the housing. According to one embodiment, a measurement scale can be positioned adjacent to and extending along the length of the slot and a plurality of indicating marks can be provided on the rod for permitting the thickness of the coating to be determined. The particular indicating mark that is used for determining the thickness of the coating is dependent upon the orientation of the gauge relative to the force of gravity. According to another aspect of the present invention, the magnet can be fabricated from a combination of at least one light rare earth element and at least one heavy rare earth element. &lt;IMAGE&gt;</p>
申请公布号 EP0481334(A1) 申请公布日期 1992.04.22
申请号 EP19910117145 申请日期 1991.10.08
申请人 DEFELSKO CORPORATION 发明人 KOCH, FRANK J.;WALMER, MARLIN S.
分类号 G01B7/00;G01B7/06 主分类号 G01B7/00
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