发明名称 Thin coatings for use in semiconductor integrated circuits and processes as antireflection coatings consisting of tungsten silicide
摘要 An antireflection coating (21) for use in integrated circuit processing consists of a film of tungsten silicide (WSi0.45) or tungsten silicon nitride (WSiN). These coatings are preferably made by sputtering, with the tungsten silicon nitride coating being made by sputtering in a nitrogen-containing atmosphere.
申请公布号 US5106786(A) 申请公布日期 1992.04.21
申请号 US19890425134 申请日期 1989.10.23
申请人 AT&T BELL LABORATORIES 发明人 BRADY, MICHAEL F.;HELMS, JR., AUBREY L.
分类号 G03F7/09;H01L21/027 主分类号 G03F7/09
代理机构 代理人
主权项
地址