发明名称 |
Thin coatings for use in semiconductor integrated circuits and processes as antireflection coatings consisting of tungsten silicide |
摘要 |
An antireflection coating (21) for use in integrated circuit processing consists of a film of tungsten silicide (WSi0.45) or tungsten silicon nitride (WSiN). These coatings are preferably made by sputtering, with the tungsten silicon nitride coating being made by sputtering in a nitrogen-containing atmosphere.
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申请公布号 |
US5106786(A) |
申请公布日期 |
1992.04.21 |
申请号 |
US19890425134 |
申请日期 |
1989.10.23 |
申请人 |
AT&T BELL LABORATORIES |
发明人 |
BRADY, MICHAEL F.;HELMS, JR., AUBREY L. |
分类号 |
G03F7/09;H01L21/027 |
主分类号 |
G03F7/09 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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