首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
MEASURING METHOD OF DEPTH OF FLAW OF OBJECT
摘要
申请公布号
JPH04120458(A)
申请公布日期
1992.04.21
申请号
JP19900241733
申请日期
1990.09.11
申请人
KOBE STEEL LTD
发明人
YANAI TOSHIYUKI;NAGAI NOBUYUKI;ARAI AKIO;SUZUKI AKIO
分类号
G01N27/83
主分类号
G01N27/83
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Extraction and fractionation of biopolymers and resins from plant materials
METHOD AND SYSTEM FOR SORTING AND SEPARATING PARTICLES
Mousse composition
Vehicular lamp
Fusion polypeptides of human serum albumin and a therapeutically active polypeptide
Lead frame for a semiconductor device
Bifunctional energy-reversible acyl-compositions
Module substrate and disk apparatus
Flip-chip component
Bi-directional temporal error concealment
VIDEO CODING/DECODING BUFFERING APPARATUS AND BUFFERING METHOD THEREOF
Low-complexity deblocking filter
Method for issuing instant mobile card using wireless network and accounting it using short distance communication
Role-dependent action for an electronic form
Heart valve leaflet locator
Portable electrotherapy device
High activity and high stability iron oxide based dehydrogenation catalyst having a low concentration of titanium and the manufacture and use thereof
Method and compositions for inhibiting formation of hydrocarbon hydrates
Process of making long chain internal fatty tertiary amines
Antigiardial agents and use thereof