发明名称 DEVICE FOR DISCRIMINATING ASSEMBLING PROPERTY OF IC
摘要 PURPOSE:To prevent a mistake caused by an oversight by inputting the data of a newly designed IC pellet to already designed IC lead frames and inspecting all wires about specific inspection items. CONSTITUTION:Shapes of various kinds of already designed IC lead frames are inputted from a keyboard 5 and stored in a storage device 3. Then the data of a new pellet are inputted from the keyboard 5. A CPU 1 selects one IC lead frame which meets the inputted number and type of pins from the IC lead frames registered in the device 3 and displays the selected lead frame together with the IC pellet. Then wires are displayed on the basis of the relation between pads and leads. After the wires are displayed, data about the wires to be connected with the pads are measured in the inputted order of pads and whether or not they meet specific conditions is checked. If one of the wires does not meet the conditions, an error mark is displayed at a pertinent place on the display 2. Such checking is performed on all wires. Therefore, a mistake caused by an oversight can be eliminated.
申请公布号 JPH04116844(A) 申请公布日期 1992.04.17
申请号 JP19900236588 申请日期 1990.09.06
申请人 NEC CORP 发明人 SUZUKI AKIO
分类号 H01L21/66;G06F17/50 主分类号 H01L21/66
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