发明名称 METALLIC CONTACT FOR SEMI-CONDUCTOR DEVICES
摘要 1286834 Semi-conductor devices GENERAL ELECTRIC CO 22 Oct 1969 [25 Nov 1968] 51840/69 Heading H1K An ohmic contact to a region of a semiconductor, e.g. silicon exposed through a layer of insulation consists of a layer of or topped with aluminium adjacent the region and an upper layer of readily solderable material such as gold, silver, tin and/or lead separated therefrom by a layer of material preventing interaction with the aluminium and comprising a layer of electroless nickel separated from the aluminium by a layer of palladium which may be deposited from a palladium chloride solution. Underlying the layer of aluminium may be a layer of one or more of titanium, vanadium and chromium. A conductive overlayer, e.g. of silver, may be vapour deposited on the barrier layer to facilitate selective application of the solderable material (gold) by electroplating through a photoresist mask. Subsequently any of the silver not plated with gold is etched away. Tincoated copper leads may be fused to the gold layers in a heated press, and the assembly consolidated by heating at 300-400‹ C. for 30 minutes. If desired lateral extensions of the contacts may be used as interconnections of an integrated circuit or as beam leads.
申请公布号 GB1286834(A) 申请公布日期 1972.08.23
申请号 GB19690051840 申请日期 1969.10.22
申请人 GENERAL ELECTRIC COMPANY 发明人 WILLIAM MICHAEL TRIGGS;CARL JOSEPH BYRNS JR.
分类号 H01L21/288;H01L23/482;H01L23/532;H01L27/00 主分类号 H01L21/288
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