发明名称 THIN FILM TRANSISTOR MEMORY
摘要 <p>PURPOSE:To make it possible to shorten write in/erase time sharply and enlarge its scale by comprising a selection transistor so as to make available carrier conduction of both a p channel and an n channel and erasing memory by p channel operation and writing in memory by n channel operation. CONSTITUTION:This invention relates to stagger structure where a semiconductor layer 36 is staggered between a source electrode 32 and a drain electrode 34, and gate electrodes 39 and 40. The portions which include the selection electrode 40, the source electrode 32, the drain electrode 32, and a semiconductor layer 36 constitute a selection transistor Tr 11 while the portions which include the memory gate electrode 39, the source electrode 32, the drain electrode 34, and the semiconductor layer 36 constitute a memory transistor Tr 10. When phosphorous doped polysilicon (poly-Si) is used as ohmic contact layers 33 and 35, it is possible to write in or erase memory to any conduction of p channel operation and n channel operation which are characteristic of the performance of transistors.</p>
申请公布号 JPH04111471(A) 申请公布日期 1992.04.13
申请号 JP19900230915 申请日期 1990.08.31
申请人 CASIO COMPUT CO LTD 发明人 YAMADA HIROYASU;SORAMOTO MIWAKO;MATSUMOTO HIROSHI;NAITO HIDEO
分类号 G11C17/00;H01L21/8247;H01L21/84;H01L27/115;H01L29/78;H01L29/786;H01L29/788;H01L29/792 主分类号 G11C17/00
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