INTEGRATED CIRCUIT DEVICE PROVIDED WITH TEST MODE FUNCTION

摘要

An integrated circuit device provided with test mode function has a plurality of terminals used for receiving and/or feeding out signals during a normal operation of the device. At least one terminal of the plurality of terminals are connected to a register for storing test mode setting data applied through the at least one terminal during a reset cycle period of the device. In accordance with the test mode setting data stored in the register, a setting of a predetermined test mode of the device is executed.